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Emerging Technologies in Computing (JETC)

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ACM Journal on Emerging Technologies in Computing Systems (JETC), Volume 5 Issue 2, July 2009

Introduction to special section: Best of NANOARCH 2008
R. Iris Bahar
Article No.: 6
DOI: 10.1145/1543438.1543439

Low-power FinFET circuit synthesis using multiple supply and threshold voltages
Prateek Mishra, Anish Muttreja, Niraj K. Jha
Article No.: 7
DOI: 10.1145/1543438.1543440

According to Moore's law, the number of transistors in a chip doubles every 18 months. The increased transistor-count leads to increased power density. Thus, in modern circuits, power efficiency is a central determinant of circuit efficiency. With...

Defects and faults in QCA-based PLAs
Michael Crocker, X. Sharon Hu, Michael Niemier
Article No.: 8
DOI: 10.1145/1543438.1543441

Defect tolerance will be critical in any system with nanoscale feature sizes. This article examines some fundamental aspects of defect tolerance for a reconfigurable system based on Quantum-dot Cellular Automata (QCA). We analyze a novel,...

Scan-chain design and optimization for three-dimensional integrated circuits
Xiaoxia Wu, Paul Falkenstern, Krishnendu Chakrabarty, Yuan Xie
Article No.: 9
DOI: 10.1145/1543438.1543442

Scan chains are widely used to improve the testability of integrated circuit (IC) designs and to facilitate fault diagnosis. For traditional 2D IC design, a number of design techniques have been proposed in the literature for scan-chain routing...

Efficient parallel testing and diagnosis of digital microfluidic biochips
Siddhartha Datta, Bharat Joshi, Arun Ravindran, Arindam Mukherjee
Article No.: 10
DOI: 10.1145/1543438.1543443

Microfluidics-based biochips consist of microfluidic arrays on rigid substrates through which movement of fluids is tightly controlled to facilitate biological reactions. Biochips are soon expected to revolutionize biosensing, clinical...

Low-overhead defect tolerance in crossbar nanoarchitectures
Mehdi B. Tahoori
Article No.: 11
DOI: 10.1145/1543438.1543444

It is anticipated that the number of defects in nanoscale devices fabricated using bottom-up self-assembly process is significantly higher than that for CMOS devices fabricated by conventional top-down lithography patterning. This is mainly...